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Jeroen Arnoldus Leonardus Johannes Raaymakers

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  • Oirschot, NL
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Metrology Apparatus
    • Publication number 20240184218
    • Publication date Jun 6, 2024
    • ASML NETHERLANDS B.V.
    • Nitesh PANDEY
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    A METROLOGY APPARATUS AND A METROLOGY METHOD
    • Publication number 20240061348
    • Publication date Feb 22, 2024
    • ASML NETHERLANDS B.V.
    • Jeroen Arnoldus Leonardus Johannes RAAYMAKERS
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    METROLOGY TOOL WITH POSITION CONTROL OF PROJECTION SYSTEM
    • Publication number 20230359127
    • Publication date Nov 9, 2023
    • ASML NETHERLANDS B.V.
    • Hans BUTLER
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    METHOD OF DETERMINING A SAMPLING SCHEME, ASSOCIATED APPARATUS AND C...
    • Publication number 20230141495
    • Publication date May 11, 2023
    • ASML NETHERLANDS B.V.
    • Hugo Augustinus Joseph CRAMER
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    METROLOGY APPARATUS
    • Publication number 20220121127
    • Publication date Apr 21, 2022
    • ASML NETHERLANDS B.V.
    • Nitesh PANDEY
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Metrology Apparatus
    • Publication number 20190384184
    • Publication date Dec 19, 2019
    • ASML NETHERLANDS B.V.
    • Nitesh Pandey
    • G01 - MEASURING TESTING
  • Information Patent Application

    AN INSPECTION SUBSTRATE AND AN INSPECTION METHOD
    • Publication number 20190179230
    • Publication date Jun 13, 2019
    • ASML NETHERLANDS B.V.
    • Jeroen Arnoldus Leonardus Johannes RAAYMAKERS
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    AN INSPECTION SUBSTRATE AND AN INSPECTION METHOD
    • Publication number 20190137885
    • Publication date May 9, 2019
    • ASML NETHERLANDS B.V.
    • Jeroen Arnoldus Leonardus Johannes RAAYMAKERS
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Inspection Substrate and an Inspection Method
    • Publication number 20180181004
    • Publication date Jun 28, 2018
    • ASML NETHERLANDS B.V.
    • Seerwan SAEED
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    LITHOGRAPHIC APPARATUS, AND DEVICE MANUFACTURING METHOD
    • Publication number 20180059555
    • Publication date Mar 1, 2018
    • ASML NETHERLANDS B.V.
    • Jan Steven Christiaan WESTERLAKEN
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY