Jeroen COTTAAR

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology method for measuring an exposed pattern and associated me...
- Patent number 12,031,909
- Issue date Jul 9, 2024
- ASML Netherlands B.V.
- Jeroen Cottaar
- G01 - MEASURING TESTING
Information Patent Grant
Metrology targets
- Patent number 11,982,946
- Issue date May 14, 2024
- ASML Netherlands B.V.
- Nikhil Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling a lithographic apparatus
- Patent number 11,809,088
- Issue date Nov 7, 2023
- ASML Netherlands B.V.
- Hadi Yagubizade
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional master equation simulations of charge-carrier tra...
- Patent number 11,636,247
- Issue date Apr 25, 2023
- Simbeyond Holding B.V.
- Reinder Coehoorn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for configuring spatial dimensions of a beam d...
- Patent number 11,366,396
- Issue date Jun 21, 2022
- ASML Netherlands B.V.
- Daan Maurits Slotboom
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining a height profile, a measurement system and a...
- Patent number 11,137,695
- Issue date Oct 5, 2021
- ASML Netherlands B.V.
- Arend Johannes Donkerbroek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for controlling lithographic apparatus, lithographic appara...
- Patent number 10,845,719
- Issue date Nov 24, 2020
- ASML Netherlands B.V.
- Rene Marinus Gerardus Johan Queens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY METHOD FOR MEASURING AN EXPOSED PATTERN AND ASSOCIATED ME...
- Publication number 20240264081
- Publication date Aug 8, 2024
- ASML NETHERLANDS B.V.
- Jeroen COTTAAR
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD FOR MEASURING AN EXPOSED PATTERN AND ASSOCIATED ME...
- Publication number 20230366815
- Publication date Nov 16, 2023
- ASML NETHERLANDS B.V.
- Jeroen COTTAAR
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...
- Publication number 20230040124
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Han-Kwang NIENHUYS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASURING METHOD AND MEASURING APPARATUS
- Publication number 20220397834
- Publication date Dec 15, 2022
- ASML NETHERLANDS B.V.
- Johan REININK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CONTROLLING A LITHOGRAPHIC APPARATUS
- Publication number 20220334500
- Publication date Oct 20, 2022
- ASML NETHERLANDS B.V.
- Hadi YAGUBIZADE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMPROVEMENTS IN METROLOGY TARGETS
- Publication number 20220260929
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- Nikhil MEHTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONFIGURING SPATIAL DIMENSIONS OF A BEAM D...
- Publication number 20210302843
- Publication date Sep 30, 2021
- ASML NETHERLANDS B.V.
- Daan Maurits SLOTBOOM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Three-dimensional master equation simulations of charge-carrier tra...
- Publication number 20210165944
- Publication date Jun 3, 2021
- Reinder Coehoorn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR CONTROLLING LITHOGRAPHIC APPARATUS, LITHOGRAPHIC APPARA...
- Publication number 20190384188
- Publication date Dec 19, 2019
- ASML NETHERLANDS B.V.
- Rene Marinus Gerardus Johan QUEENS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A METHOD OF DETERMINING A HEIGHT PROFILE, A MEASUREMENT SYSTEM AND...
- Publication number 20190294060
- Publication date Sep 26, 2019
- ASML Nethertands B.V.
- Arend Johannes DONKERBROEK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Jeroen COTTAAR

Person

Patents Grantslast 30 patents

Metrology method for measuring an exposed pattern and associated me...

Metrology targets

Method for controlling a lithographic apparatus

Three-dimensional master equation simulations of charge-carrier tra...

Method and apparatus for configuring spatial dimensions of a beam d...

Method of determining a height profile, a measurement system and a...

Methods for controlling lithographic apparatus, lithographic appara...

Patents Applicationslast 30 patents

METROLOGY METHOD FOR MEASURING AN EXPOSED PATTERN AND ASSOCIATED ME...

METROLOGY METHOD FOR MEASURING AN EXPOSED PATTERN AND ASSOCIATED ME...

METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...

MEASURING METHOD AND MEASURING APPARATUS

METHOD FOR CONTROLLING A LITHOGRAPHIC APPARATUS

IMPROVEMENTS IN METROLOGY TARGETS

METHOD AND APPARATUS FOR CONFIGURING SPATIAL DIMENSIONS OF A BEAM D...

Three-dimensional master equation simulations of charge-carrier tra...

METHODS FOR CONTROLLING LITHOGRAPHIC APPARATUS, LITHOGRAPHIC APPARA...

A METHOD OF DETERMINING A HEIGHT PROFILE, A MEASUREMENT SYSTEM AND...