Jeroen Johan Maarten VAN DE WIJDEVEN

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Support, vibration isolation system, lithographic apparatus, object...
- Patent number 11,828,344
- Issue date Nov 28, 2023
- ASML Netherlands B.V.
- Jeroen Johan Maarten Van De Wijdeven
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 10,185,224
- Issue date Jan 22, 2019
- ASML Netherlands B.V.
- Ferry Zijp
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 9,927,722
- Issue date Mar 27, 2018
- ASML Netherlands B.V.
- Koos Van Berkel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for inspection and metrology
- Patent number 9,811,001
- Issue date Nov 7, 2017
- ASML Netherlands B.V.
- Peter Danny Van Voorst
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Controller, lithographic apparatus, method of controlling the posit...
- Patent number 8,854,607
- Issue date Oct 7, 2014
- ASML Netherlands B.V.
- Ramidin Izair Kamidi
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
A SENSOR POSITIONING METHOD, A POSITIONING SYSTEM, A LITHOGRAPHIC A...
- Publication number 20250004390
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Jeroen Johan Maarten VAN DE WIJDEVEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD
- Publication number 20240160151
- Publication date May 16, 2024
- ASML NETHERLANDS B.V.
- Willem Marie Julia Marcel COENE
- G02 - OPTICS
Information Patent Application
SUPPORT, VIBRATION ISOLATION SYSTEM, LITHOGRAPHIC APPARATUS, OBJECT...
- Publication number 20220290734
- Publication date Sep 15, 2022
- ASML NETHERLANDS B.V.
- Jeroen Johan Maarten VAN DE WIJDEVEN
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20180120714
- Publication date May 3, 2018
- ASML NETHERLANDS B.V.
- Ferry Zijp
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20160266503
- Publication date Sep 15, 2016
- ASML NETHERLANDS B.V.
- Peter Danny Van Voorst
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
- Publication number 20160246189
- Publication date Aug 25, 2016
- ASML NETHERLANDS B.V.
- Koos VAN BERKEL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Jeroen Johan Maarten VAN DE WIJDEVEN

Person

Patents Grantslast 30 patents

Support, vibration isolation system, lithographic apparatus, object...

Method and apparatus for inspection and metrology

Method and apparatus for inspection and metrology

Method and apparatus for inspection and metrology

Controller, lithographic apparatus, method of controlling the posit...

Patents Applicationslast 30 patents

A SENSOR POSITIONING METHOD, A POSITIONING SYSTEM, A LITHOGRAPHIC A...

DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD

SUPPORT, VIBRATION ISOLATION SYSTEM, LITHOGRAPHIC APPARATUS, OBJECT...

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY

METHOD AND APPARATUS FOR INSPECTION AND METROLOGY