Jerome Bombal

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Patents Grantslast 30 patents

Information Patent Grant
Overflow protected first-in first-out architecture
- Patent number 7,203,803
- Issue date Apr 10, 2007
- Texas Instruments Incorporated
- Jerome Bombal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of discriminating between different types of scan failures,...
- Patent number 6,970,815
- Issue date Nov 29, 2005
- Koninklijke Philips Electronics N.V.
- Jerome Bombal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer implemented circuit synthesis system
- Patent number 6,671,870
- Issue date Dec 30, 2003
- Koninklijke Philips Electronics N.V.
- Laurent Souef
- G01 - MEASURING TESTING
Information Patent Grant
Design for test area optimization algorithm
- Patent number 6,311,318
- Issue date Oct 30, 2001
- VLSI Technology, Inc.
- Laurent Souef
- G01 - MEASURING TESTING
Information Patent Grant
Pseudo-scan testing using hardware-accessible IC structures
- Patent number 6,141,782
- Issue date Oct 31, 2000
- VLSI Technology, Inc.
- Jerome Bombal
- G01 - MEASURING TESTING
Information Patent Grant
Low power scannable counter
- Patent number 5,960,052
- Issue date Sep 28, 1999
- VLSI Technology, Inc.
- Jerome Bombal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scan testable first-in first-out architecture
- Publication number 20050114612
- Publication date May 26, 2005
- Jerome Bombal
- G11 - INFORMATION STORAGE
Information Patent Application
Overflow protected first-in first-out architecture
- Publication number 20050033907
- Publication date Feb 10, 2005
- Jerome Bombal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer implemented circuit synthesis system
- Publication number 20020032898
- Publication date Mar 14, 2002
- Laurent Souef
- G01 - MEASURING TESTING