Jerome Bougie

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Bromont, CA

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Patents Grantslast 30 patents

Information Patent Grant
Connecting mid-board optical modules
- Patent number 10,073,223
- Issue date Sep 11, 2018
- International Business Machines Corporation
- Tymon Barwicz
- G02 - OPTICS
Information Patent Grant
Connecting mid-board optical modules
- Patent number 9,835,804
- Issue date Dec 5, 2017
- Intenational Business Machines Corporation
- Tymon Barwicz
- G02 - OPTICS
Information Patent Grant
Connecting mid-board optical modules
- Patent number 9,720,188
- Issue date Aug 1, 2017
- International Business Machines Corporation
- Tymon Barwicz
- G02 - OPTICS
Information Patent Grant
Connecting mid-board electronic devices
- Patent number 9,706,670
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Tymon Barwicz
- G02 - OPTICS
Information Patent Grant
Self-centering nest for electronics testing
- Patent number 7,696,770
- Issue date Apr 13, 2010
- International Business Machines Corportion
- Francois Binette
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONNECTING MID-BOARD OPTICAL MODULES
- Publication number 20180052285
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Tymon BARWICZ
- G02 - OPTICS
Information Patent Application
CONNECTING MID-BOARD OPTICAL MODULES
- Publication number 20170199337
- Publication date Jul 13, 2017
- International Business Machines Corporation
- Tymon BARWICZ
- G02 - OPTICS
Information Patent Application
CONNECTING MID-BOARD ELECTRONIC DEVICES
- Publication number 20170196097
- Publication date Jul 6, 2017
- International Business Machines Corporation
- Tymon BARWICZ
- G02 - OPTICS
Information Patent Application
CONNECTING MID-BOARD OPTICAL MODULES
- Publication number 20170192181
- Publication date Jul 6, 2017
- International Business Machines Corporation
- Tymon Barwicz
- G02 - OPTICS
Information Patent Application
SELF-CENTERING NEST FOR ELECTRONICS TESTING
- Publication number 20080180128
- Publication date Jul 31, 2008
- IBM Corporation
- Francois Binette
- G01 - MEASURING TESTING