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Jerome D. Schick
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LaGrangeville, NY, US
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last 30 patents
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Patent Grant
Method and apparatus for determining the thickness of an interfacia...
Patent number
5,138,256
Issue date
Aug 11, 1992
International Business Machines Corp.
Richard J. Murphy
G01 - MEASURING TESTING
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Patent Grant
Programmed control of electron beam power
Patent number
4,594,554
Issue date
Jun 10, 1986
International Business Machines Corporation
Jerome D. Schick
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Non-volatile memory and switching device
Patent number
4,503,521
Issue date
Mar 5, 1985
International Business Machines Corporation
Jerome D. Schick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determination of true electrical channel length of surface FET
Patent number
4,453,127
Issue date
Jun 5, 1984
International Business Machines Corporation
Jerome D. Schick
G01 - MEASURING TESTING