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Jerome E. Deis

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  • Kettering, OH, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method of making coordinate measurements
    • Patent number 4,550,418
    • Issue date Oct 29, 1985
    • The Warner & Swasey Company
    • Jerome E. Deis
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Bi-axial probe
    • Patent number 4,136,458
    • Issue date Jan 30, 1979
    • The Bendix Corporation
    • Frederick K. Bell
    • G01 - MEASURING TESTING