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Jerome L. Cann
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Jericho, VT, US
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Patents Grants
last 30 patents
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Patent Grant
Mapping density and temperature of a chip, in situ
Patent number
9,140,669
Issue date
Sep 22, 2015
International Business Machines Corporation
Jerome L. Cann
G01 - MEASURING TESTING
Information
Patent Grant
Mapping density and temperature of a chip, in situ
Patent number
8,987,843
Issue date
Mar 24, 2015
International Business Machines Corporation
Jerome L. Cann
G01 - MEASURING TESTING
Information
Patent Grant
Test structure and methodology for three-dimensional semiconductor...
Patent number
8,729,549
Issue date
May 20, 2014
International Business Machines Corporation
Kerry Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structure and methodology for three-dimensional semiconductor...
Patent number
8,294,149
Issue date
Oct 23, 2012
International Business Machines Corporation
Kerry Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection methods and structures for visualizing and/or detecting...
Patent number
7,230,335
Issue date
Jun 12, 2007
International Business Machines Corporation
Jerome L. Cann
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
MAPPING DENSITY AND TEMPERATURE OF A CHIP, IN SITU
Publication number
20150021605
Publication date
Jan 22, 2015
International Business Machines Corporation
Jerome L. CANN
G01 - MEASURING TESTING
Information
Patent Application
MAPPING DENSITY AND TEMPERATURE OF A CHIP, IN SITU
Publication number
20140124878
Publication date
May 8, 2014
International Business Machines Corporation
Jerome L. Cann
G01 - MEASURING TESTING
Information
Patent Application
TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...
Publication number
20120262197
Publication date
Oct 18, 2012
International Business Machines Corporation
Kerry Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...
Publication number
20120264241
Publication date
Oct 18, 2012
International Business Machines Corporation
Kerry Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR...
Publication number
20090114913
Publication date
May 7, 2009
International Business Machines Corporation
Kerry Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION METHODS AND STRUCTURES FOR VISUALIZING AND/OR DETECTING...
Publication number
20060071208
Publication date
Apr 6, 2006
International Business Machines Corporation
Jerome L. Cann
H01 - BASIC ELECTRIC ELEMENTS