Jerry Choy

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for a probe card
- Patent number 9,921,262
- Issue date Mar 20, 2018
- Elma Electronic Inc.
- Walter A Schindler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for a Probe Card
- Publication number 20160299173
- Publication date Oct 13, 2016
- ELMA ELECTRONIC INC.
- Walter A. Schindler
- G01 - MEASURING TESTING