Jerry D. Hayes

Person

Georgetown, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and test system for fast determination of parameter variatio...
- Patent number 8,862,426
- Issue date Oct 14, 2014
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for bias temperature instability recovery measurements
- Patent number 8,676,516
- Issue date Mar 18, 2014
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of long range variability
- Patent number 8,336,008
- Issue date Dec 18, 2012
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for bias temperature instability recovery measurements
- Patent number 8,229,683
- Issue date Jul 24, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Parallel array architecture for constant current electro-migration...
- Patent number 8,217,671
- Issue date Jul 10, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Configurable PSRO structure for measuring frequency dependent capac...
- Patent number 8,154,309
- Issue date Apr 10, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Measurement methodology and array structure for statistical stress...
- Patent number 8,120,356
- Issue date Feb 21, 2012
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
On-chip measurement of signals
- Patent number 8,089,296
- Issue date Jan 3, 2012
- International Business Machines Corporation
- Kanak Behari Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for evaluating timing in an integrated circuit
- Patent number 7,962,874
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Eric A. Foreman
- G01 - MEASURING TESTING
Information Patent Grant
Delay-based bias temperature instability recovery measurements for...
- Patent number 7,949,482
- Issue date May 24, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Grant
Slack sensitivity to parameter variation based timing analysis
- Patent number 7,870,525
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Array-based early threshold voltage recovery characterization measu...
- Patent number 7,868,640
- Issue date Jan 11, 2011
- International Business Machines Corporation
- Kanak B Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating wiring routes with matching delay in the prese...
- Patent number 7,865,861
- Issue date Jan 4, 2011
- International Business Machines Corporation
- Peter A. Habitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for statistical CMOS device characterization
- Patent number 7,834,649
- Issue date Nov 16, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating wiring routes with matching delay in the prese...
- Patent number 7,823,115
- Issue date Oct 26, 2010
- International Business Machines Corporation
- Peter A. Habitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterization circuit for fast determination of device capacitan...
- Patent number 7,818,137
- Issue date Oct 19, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for statistical CMOS device characterization
- Patent number 7,782,076
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring statistics of dram parameters wi...
- Patent number 7,768,814
- Issue date Aug 3, 2010
- International Business Machines Corporation
- Kanak B. Argawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Slack sensitivity to parameter variation based timing analysis
- Patent number 7,716,616
- Issue date May 11, 2010
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method of analyzing timing effects of spatial distributi...
- Patent number 7,680,626
- Issue date Mar 16, 2010
- International Business Machines Corporation
- David J. Hathaway
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating timing in an integrated circuit
- Patent number 7,444,608
- Issue date Oct 28, 2008
- International Business Machines Corporation
- Eric A. Foreman
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating wiring routes with matching delay in the prese...
- Patent number 7,418,689
- Issue date Aug 26, 2008
- International Business Machines Corporation
- Peter A. Habitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Slack sensitivity to parameter variation based timing analysis
- Patent number 7,401,307
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for statistical CMOS device characterization
- Patent number 7,397,259
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing shapes correction of a multi-cell...
- Patent number 7,302,673
- Issue date Nov 27, 2007
- International Business Machines Corporation
- Peter Anton Habitz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method of analyzing timing effects of spatial distributi...
- Patent number 7,280,939
- Issue date Oct 9, 2007
- International Business Machines Corporation
- David J. Hathaway
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ring oscillator structure and method of separating random and syste...
- Patent number 7,266,474
- Issue date Sep 4, 2007
- International Business Machines Corporation
- Peter A. Habitz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing input/output floor planning on...
- Patent number 7,231,335
- Issue date Jun 12, 2007
- International Business Machines Corporation
- Jerry D. Hayes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable sigma adjust methodology for static timing
- Patent number 7,174,523
- Issue date Feb 6, 2007
- International Business Machines Corporation
- James J. Engel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating timing in an integrated circuit
- Patent number 7,089,143
- Issue date Aug 8, 2006
- International Business Machines Corporation
- Eric A. Foreman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS
- Publication number 20120262187
- Publication date Oct 18, 2012
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS
- Publication number 20110074394
- Publication date Mar 31, 2011
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
Characterization of Long Range Variability
- Publication number 20110078641
- Publication date Mar 31, 2011
- International Business Machines Corporation
- James A. Culp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Parallel Array Architecture for Constant Current Electro-Migration...
- Publication number 20100327892
- Publication date Dec 30, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP MEASUREMENT OF SIGNALS
- Publication number 20100321050
- Publication date Dec 23, 2010
- International Business Machines Corporation
- Kanak Behari Agarwal
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE PSRO STRUCTURE FOR MEASURING FREQUENCY DEPENDENT CAPAC...
- Publication number 20100321042
- Publication date Dec 23, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS...
- Publication number 20100318313
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR STATISTICAL CMOS DEVICE CHARACTERIZATION
- Publication number 20100225348
- Publication date Sep 9, 2010
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measuring Statistics of Dram Parameters wi...
- Publication number 20100074040
- Publication date Mar 25, 2010
- International Business Machines Corporation
- Kanak B. Agarwal
- G11 - INFORMATION STORAGE
Information Patent Application
Delay-Based Bias Temperature Instability Recovery Measurements for...
- Publication number 20090319202
- Publication date Dec 24, 2009
- International Business Machines Corporation
- Fadi H. Gebara
- G01 - MEASURING TESTING
Information Patent Application
Array-Based Early Threshold Voltage Recovery Characterization Measu...
- Publication number 20090251167
- Publication date Oct 8, 2009
- International Business Machines Corporation
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION CIRCUIT FOR FAST DETERMINATION OF DEVICE CAPACITAN...
- Publication number 20090160463
- Publication date Jun 25, 2009
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND TEST SYSTEM FOR FAST DETERMINATION OF PARAMETER VARIATIO...
- Publication number 20090160477
- Publication date Jun 25, 2009
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ISOLATING DOPANT FLUCTUATION AND DEVICE LENGT...
- Publication number 20090164155
- Publication date Jun 25, 2009
- KANAK B. AGARWAL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGRATED CIRCUIT
- Publication number 20080313590
- Publication date Dec 18, 2008
- International Business Machines Corporation
- Eric A. FOREMAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR STATISTICAL CMOS DEVICE CHARACTERIZATION
- Publication number 20080284460
- Publication date Nov 20, 2008
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS
- Publication number 20080216036
- Publication date Sep 4, 2008
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Generating Wiring Routes with Matching Delay in the Prese...
- Publication number 20080201683
- Publication date Aug 21, 2008
- International Business Machines Corporation
- Peter A. Habitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Generating Wiring Routes with Matching Delay in the Prese...
- Publication number 20080195993
- Publication date Aug 14, 2008
- International Business Machines Corporation
- Peter A. Habitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS TECHNIQUES TO REDUCE SIMULATIONS TO CHARACTERIZE THE EFFEC...
- Publication number 20080126061
- Publication date May 29, 2008
- Jerry D. Hayes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS
- Publication number 20080052656
- Publication date Feb 28, 2008
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF ANALYZING TIMING EFFECTS OF SPATIAL DISTRIBUTI...
- Publication number 20070220345
- Publication date Sep 20, 2007
- International Business Machines Corporation
- David J. Hathaway
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Variable Sigma Adjust Methodology For Static Timing
- Publication number 20070089078
- Publication date Apr 19, 2007
- James J. Engel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR RETICLE SHAPES ANALYSIS AND CORRECTION
- Publication number 20070061771
- Publication date Mar 15, 2007
- International Business Machines Corporation
- Peter Anton Habitz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
RING OSCILLATOR STRUCTURE AND METHOD OF SEPARATING RANDOM AND SYSTE...
- Publication number 20070050164
- Publication date Mar 1, 2007
- International Business Machines Corporation
- Peter A. Habitz
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF GENERATING WIRING ROUTES WITH MATCHING DELAY IN THE PRESE...
- Publication number 20060248488
- Publication date Nov 2, 2006
- International Business Machines Corporation
- Peter A. Habitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGATED CIRCUIT
- Publication number 20060195807
- Publication date Aug 31, 2006
- International Business Machines Corporation
- Eric A. Foreman
- G01 - MEASURING TESTING
Information Patent Application
SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS
- Publication number 20060101361
- Publication date May 11, 2006
- International Business Machines Corporation
- Eric A. Foreman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VARIABLE SIGMA ADJUST METHODOLOGY FOR STATIC TIMING
- Publication number 20060026544
- Publication date Feb 2, 2006
- International Business Machines Corporation
- James J. Engel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGRATED CIRCUIT
- Publication number 20050246116
- Publication date Nov 3, 2005
- International Business Machines Corporation
- Eric A. Foreman
- G01 - MEASURING TESTING

Jerry D. Hayes

Person

Patents Grantslast 30 patents

Method and test system for fast determination of parameter variatio...

Test circuit for bias temperature instability recovery measurements

Characterization of long range variability

Test circuit for bias temperature instability recovery measurements

Parallel array architecture for constant current electro-migration...

Configurable PSRO structure for measuring frequency dependent capac...

Measurement methodology and array structure for statistical stress...

On-chip measurement of signals

Method and system for evaluating timing in an integrated circuit

Delay-based bias temperature instability recovery measurements for...

Slack sensitivity to parameter variation based timing analysis

Array-based early threshold voltage recovery characterization measu...

Method of generating wiring routes with matching delay in the prese...

Method and apparatus for statistical CMOS device characterization

Method of generating wiring routes with matching delay in the prese...

Characterization circuit for fast determination of device capacitan...

Method and apparatus for statistical CMOS device characterization

Method and apparatus for measuring statistics of dram parameters wi...

Slack sensitivity to parameter variation based timing analysis

System and method of analyzing timing effects of spatial distributi...

Method and system for evaluating timing in an integrated circuit

Method of generating wiring routes with matching delay in the prese...

Slack sensitivity to parameter variation based timing analysis

Method and apparatus for statistical CMOS device characterization

Method and system for performing shapes correction of a multi-cell...

System and method of analyzing timing effects of spatial distributi...

Ring oscillator structure and method of separating random and syste...

Method and apparatus for performing input/output floor planning on...

Variable sigma adjust methodology for static timing

Method and system for evaluating timing in an integrated circuit

Patents Applicationslast 30 patents

TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS

TEST CIRCUIT FOR BIAS TEMPERATURE INSTABILITY RECOVERY MEASUREMENTS

Characterization of Long Range Variability

Parallel Array Architecture for Constant Current Electro-Migration...

ON-CHIP MEASUREMENT OF SIGNALS

CONFIGURABLE PSRO STRUCTURE FOR MEASURING FREQUENCY DEPENDENT CAPAC...

MEASUREMENT METHODOLOGY AND ARRAY STRUCTURE FOR STATISTICAL STRESS...

METHOD AND APPARATUS FOR STATISTICAL CMOS DEVICE CHARACTERIZATION

Method and Apparatus for Measuring Statistics of Dram Parameters wi...

Delay-Based Bias Temperature Instability Recovery Measurements for...

Array-Based Early Threshold Voltage Recovery Characterization Measu...

CHARACTERIZATION CIRCUIT FOR FAST DETERMINATION OF DEVICE CAPACITAN...

METHOD AND TEST SYSTEM FOR FAST DETERMINATION OF PARAMETER VARIATIO...

METHOD AND SYSTEM FOR ISOLATING DOPANT FLUCTUATION AND DEVICE LENGT...

METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGRATED CIRCUIT

METHOD AND APPARATUS FOR STATISTICAL CMOS DEVICE CHARACTERIZATION

SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS

Method of Generating Wiring Routes with Matching Delay in the Prese...

Method of Generating Wiring Routes with Matching Delay in the Prese...

ANALYSIS TECHNIQUES TO REDUCE SIMULATIONS TO CHARACTERIZE THE EFFEC...

SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS

SYSTEM AND METHOD OF ANALYZING TIMING EFFECTS OF SPATIAL DISTRIBUTI...

Variable Sigma Adjust Methodology For Static Timing

METHOD FOR RETICLE SHAPES ANALYSIS AND CORRECTION

RING OSCILLATOR STRUCTURE AND METHOD OF SEPARATING RANDOM AND SYSTE...

METHOD OF GENERATING WIRING ROUTES WITH MATCHING DELAY IN THE PRESE...

METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGATED CIRCUIT

SLACK SENSITIVITY TO PARAMETER VARIATION BASED TIMING ANALYSIS

VARIABLE SIGMA ADJUST METHODOLOGY FOR STATIC TIMING

METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGRATED CIRCUIT