Jerry Dimsdale

Person

Berkeley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 7,215,430
- Issue date May 8, 2007
- Leica Geosystems HDS LLC
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 7,184,036
- Issue date Feb 27, 2007
- Leica Geosystems HDS LLC
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,847,462
- Issue date Jan 25, 2005
- Leica Geosystems HDS, Inc.
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,734,849
- Issue date May 11, 2004
- Cyra Technologies, Inc.
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,512,518
- Issue date Jan 28, 2003
- Cyra Technologies, Inc.
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,512,993
- Issue date Jan 28, 2003
- Cyra Technologies, Inc.
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,473,079
- Issue date Oct 29, 2002
- Cyra Technologies, Inc.
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,420,698
- Issue date Jul 16, 2002
- Cyra Technologies, Inc.
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,330,523
- Issue date Dec 11, 2001
- Cyra Technologies, Inc.
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 6,246,468
- Issue date Jun 12, 2001
- Cyra Technologies
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Grant
Integrated system for quickly and accurately imaging and modeling t...
- Patent number 5,988,862
- Issue date Nov 23, 1999
- Cyra Technologies, Inc.
- Ben Kacyra
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for determining range in 3D imaging systems
- Publication number 20060007422
- Publication date Jan 12, 2006
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20050099637
- Publication date May 12, 2005
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20040051711
- Publication date Mar 18, 2004
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20030001835
- Publication date Jan 2, 2003
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20020158870
- Publication date Oct 31, 2002
- Mark Brunkhart
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20020149585
- Publication date Oct 17, 2002
- Ben K. Kacyra
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20020145607
- Publication date Oct 10, 2002
- Jerry Dimsdale
- G01 - MEASURING TESTING
Information Patent Application
Integrated system for quickly and accurately imaging and modeling t...
- Publication number 20020059042
- Publication date May 16, 2002
- Ben K. Kacyra
- G01 - MEASURING TESTING

Jerry Dimsdale

Person

Patents Grantslast 30 patents

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Patents Applicationslast 30 patents

System and method for determining range in 3D imaging systems

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...

Integrated system for quickly and accurately imaging and modeling t...