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Jerry E. Cahill
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Trumbull, CT, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical resonance analysis system
Patent number
7,251,085
Issue date
Jul 31, 2007
Applera Corporation
Dar Bahatt
G01 - MEASURING TESTING
Information
Patent Grant
Optical resonance analysis system
Patent number
6,873,417
Issue date
Mar 29, 2005
Applera Corporation
Dar Bahatt
G01 - MEASURING TESTING
Information
Patent Grant
Optical resonance analysis system
Patent number
6,600,563
Issue date
Jul 29, 2003
Applera Corporation
Dar Bahatt
G01 - MEASURING TESTING
Information
Patent Grant
Standardizing a spectrometric instrument
Patent number
6,049,762
Issue date
Apr 11, 2000
Perkin Elmer LLC
Alan M. Ganz
G01 - MEASURING TESTING
Information
Patent Grant
Standardization of chromatographic systems
Patent number
5,958,246
Issue date
Sep 28, 1999
The Perkin-Elmer Corporation
Andrew Tipler
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to compensate for gas chromatograph column per...
Patent number
5,915,269
Issue date
Jun 22, 1999
The Perkin-Elmer Corporation
Jerry E. Cahill
G01 - MEASURING TESTING
Information
Patent Grant
Photometric instrument with optical fibers for analyzing remote sam...
Patent number
5,526,451
Issue date
Jun 11, 1996
The Perkin-Elmer Corporation
Jerry E. Cahill
G02 - OPTICS
Information
Patent Grant
Optical switching apparatus with retroreflector
Patent number
5,481,631
Issue date
Jan 2, 1996
The Perkin-Elmer Corp.
Jerry E. Cahill
G02 - OPTICS
Information
Patent Grant
Photometric instrument with optical fibers for analyzing remote sam...
Patent number
5,428,696
Issue date
Jun 27, 1995
The Perkin-Elmer Corporation
Jerry E. Cahill
G02 - OPTICS
Information
Patent Grant
Correction of spectra for stray radiation
Patent number
5,428,558
Issue date
Jun 27, 1995
The Perkin-Elmer Corporation
Jerry E. Cahill
G01 - MEASURING TESTING
Information
Patent Grant
Automatic digital wavelength calibration system for a spectrophotom...
Patent number
4,692,883
Issue date
Sep 8, 1987
The Perkin-Elmer Corporation
Michael R. Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for converting the wavelength resolution of a spectrophot...
Patent number
4,669,880
Issue date
Jun 2, 1987
The Perkin-Elmer Corporation
Michael R. Nelson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Optical Resonance Analysis System
Publication number
20060262313
Publication date
Nov 23, 2006
Applera Corporation
Dar Bahatt
G01 - MEASURING TESTING
Information
Patent Application
Optical resonance analysis system
Publication number
20050162657
Publication date
Jul 28, 2005
Applera Corporation
Dar Bahatt
G01 - MEASURING TESTING
Information
Patent Application
Optical resonance analysis system
Publication number
20030210399
Publication date
Nov 13, 2003
Applera Corporation
Dar Bahatt
G01 - MEASURING TESTING