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Jerry M. Soden
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Placitas, NM, US
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last 30 patents
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Patent Grant
System and method for floating-substrate passive voltage contrast
Patent number
7,525,325
Issue date
Apr 28, 2009
Sandia Corporation
Mark W. Jenkins
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for defect testing of integrated circuits
Patent number
6,031,386
Issue date
Feb 29, 2000
Sandia Corporation
Edward I. Cole
G01 - MEASURING TESTING
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Patent Grant
Ion-beam apparatus and method for analyzing and controlling integra...
Patent number
5,844,416
Issue date
Dec 1, 1998
Sandia Corporation
Ann N. Campbell
G01 - MEASURING TESTING
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Patent Grant
Light-induced voltage alteration for integrated circuit analysis
Patent number
5,430,305
Issue date
Jul 4, 1995
The United States of America as represented by the United States Department o...
Edward I. Cole
G01 - MEASURING TESTING