Jerry Tsiang

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterizing distribution signatures in integrated circuit techno...
- Patent number 7,099,789
- Issue date Aug 29, 2006
- Advanced Micro Devices, Inc.
- Franklyn Shihyu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for automated wafer level testing and reliabil...
- Patent number 5,822,717
- Issue date Oct 13, 1998
- Advanced Micro Devices, Inc.
- Jerry Tsiang
- G01 - MEASURING TESTING