Jerry Wei-Jen Shan

Person

  • Raritan, NJ, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Surface profile measurement processing method

    • Patent number 7,519,502
    • Issue date Apr 14, 2009
    • The United States of America as represented by the Secretary of the Navy
    • Jason Bradley Carneal
    • G01 - MEASURING TESTING