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Jerzy Lobacz
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San Mateo, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Wafer level burn-in and electrical test system and method
Patent number
7,928,754
Issue date
Apr 19, 2011
AEHR Test Systems
Donald Paul Richmond, II
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Wafer level burn-in and electrical test system and method
Patent number
7,619,428
Issue date
Nov 17, 2009
AEHR Test Systems
Donald Paul Richmond, II
G01 - MEASURING TESTING
Information
Patent Grant
Wafer level burn-in and electrical test system and method
Patent number
6,682,945
Issue date
Jan 27, 2004
AEHR Test Systems
Donald Paul Richmond
G01 - MEASURING TESTING
Information
Patent Grant
Wafer level burn-in and test methods
Patent number
6,580,283
Issue date
Jun 17, 2003
AEHR Test Systems
Mark Charles Carbone
G01 - MEASURING TESTING
Information
Patent Grant
Assembly structure for making integrated circuit chip probe cards
Patent number
5,884,395
Issue date
Mar 23, 1999
Probe Technology
Krzysztof Dabrowiecki
G01 - MEASURING TESTING
Information
Patent Grant
Membrane for holding a probe tip in proper location
Patent number
5,742,174
Issue date
Apr 21, 1998
Probe Technology
January Kister
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Wafer Level Burn-In and Electrical Test System and Method
Publication number
20100176836
Publication date
Jul 15, 2010
Donald Paul Richmond, II
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for, and method of, positioning an interface unit of an a...
Publication number
20070213847
Publication date
Sep 13, 2007
William T. Sprague
G01 - MEASURING TESTING
Information
Patent Application
Wafer level burn-in and electrical test system and method
Publication number
20040113645
Publication date
Jun 17, 2004
Aehr Test Systems
Donald Paul Richmond
G01 - MEASURING TESTING
Information
Patent Application
Wafer level burn-in and electrical test system and method
Publication number
20020048826
Publication date
Apr 25, 2002
Donald Paul Richmond
G01 - MEASURING TESTING