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Jhobe Steadman
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for reducing analyzer variability using a normalization target
Patent number
11,953,428
Issue date
Apr 9, 2024
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Grant
System and apparatus for point-of-care diagnostics
Patent number
11,131,666
Issue date
Sep 28, 2021
Quidel Corporation
Richard L. Egan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method for reducing analyzer variability using a normalization target
Patent number
10,845,300
Issue date
Nov 24, 2020
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Grant
Method for reducing analyzer variability using a normalization target
Patent number
10,495,574
Issue date
Dec 3, 2019
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Grant
System and apparatus for point-of-care diagnostics
Patent number
10,281,462
Issue date
May 7, 2019
Quidel Corporation
Richard L. Egan
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Method for reducing analyzer variability using a normalization target
Patent number
9,989,466
Issue date
Jun 5, 2018
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Grant
System and apparatus for point-of-care diagnostics
Patent number
9,207,181
Issue date
Dec 8, 2015
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Grant
Microarray hybridization device having bubble-fracturing elements
Patent number
7,238,521
Issue date
Jul 3, 2007
Biocept, Inc.
Soonkap Hahn
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Automated process line
Patent number
6,730,517
Issue date
May 4, 2004
Sequenom, Inc.
Hubert Köster
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20210389316
Publication date
Dec 16, 2021
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCING ANALYZER VARIABILITY USING A NORMALIZATION TARGET
Publication number
20210041353
Publication date
Feb 11, 2021
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCING ANALYZER VARIABILITY USING A NORMALIZATION TARGET
Publication number
20200064264
Publication date
Feb 27, 2020
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Application
Collision Avoidance Systems
Publication number
20200043353
Publication date
Feb 6, 2020
Jhobe Steadman
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20190271695
Publication date
Sep 5, 2019
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCING ANALYZER VARIABILITY USING A NORMALIZATION TARGET
Publication number
20180259453
Publication date
Sep 13, 2018
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20160054316
Publication date
Feb 25, 2016
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR REDUCING ANALYZER VARIABILITY USING A NORMALIZATION TARGET
Publication number
20150160134
Publication date
Jun 11, 2015
Quidel Corporation
David Dickson Booker
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND APPARATUS FOR POINT-OF-CARE DIAGNOSTICS
Publication number
20130230844
Publication date
Sep 5, 2013
Quidel Corporation
Richard L. Egan
G01 - MEASURING TESTING
Information
Patent Application
Microarray hybridization device
Publication number
20050112589
Publication date
May 26, 2005
Soonkap Hahn
C40 - COMBINATORIAL CHEMISTRY
Information
Patent Application
AUTOMATED PROCESS LINE
Publication number
20020009394
Publication date
Jan 24, 2002
HUBERT KOSTER
G01 - MEASURING TESTING