Ji Ma

Person

Thousand Oaks, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,197,596
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,995,765
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,810,713
- Issue date Nov 7, 2017
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,523,707
- Issue date Dec 20, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,291,640
- Issue date Mar 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,274,139
- Issue date Mar 1, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,244,096
- Issue date Jan 26, 2016
- Bruke Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 8,904,560
- Issue date Dec 2, 2014
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 8,650,660
- Issue date Feb 11, 2014
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 8,646,109
- Issue date Feb 4, 2014
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20160274144
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
- Publication number 20160266166
- Publication date Sep 15, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160258979
- Publication date Sep 8, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
- Publication number 20150198630
- Publication date Jul 16, 2015
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20140230103
- Publication date Aug 14, 2014
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20140223615
- Publication date Aug 7, 2014
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20130276174
- Publication date Oct 17, 2013
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20120131702
- Publication date May 24, 2012
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE
- Publication number 20110167524
- Publication date Jul 7, 2011
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Closed loop controller and method for fast scanning probe microscopy
- Publication number 20080277582
- Publication date Nov 13, 2008
- Veeco Instruments Inc.
- Jian Shi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of electrical property measurement using an AF...

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus of electrical property measurement using an AF...

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Patents Applicationslast 30 patents

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Closed Loop Controller and Method for Fast Scanning Probe Microscopy

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Closed Loop Controller and Method for Fast Scanning Probe Microscopy

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE

Closed loop controller and method for fast scanning probe microscopy