Ji-Ping Li

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Evaluating a multi-layered structure for voids
- Patent number 7,301,619
- Issue date Nov 27, 2007
- Applied Materials, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a property of a layer in a multi...
- Patent number 7,141,440
- Issue date Nov 28, 2006
- Applied Materials, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating a multi-layered structure for voids
- Patent number 7,088,444
- Issue date Aug 8, 2006
- Applied Materials, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating a multi-layered structure for voids
- Patent number 7,064,822
- Issue date Jun 20, 2006
- Applied Materials, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Identifying defects in a conductive structure of a wafer, based on...
- Patent number 6,971,791
- Issue date Dec 6, 2005
- Boxer Cross, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a property of a layer in a multi...
- Patent number 6,958,814
- Issue date Oct 25, 2005
- Applied Materials, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Evaluating a multi-layered structure for voids
- Patent number 6,885,444
- Issue date Apr 26, 2005
- Boxer Cross Inc
- Peter G. Borden
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Evaluating a multi-layered structure for voids
- Publication number 20060232768
- Publication date Oct 19, 2006
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring a property of a layer in a multi...
- Publication number 20050200850
- Publication date Sep 15, 2005
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Application
Evaluating a multi-layered structure for voids
- Publication number 20050186776
- Publication date Aug 25, 2005
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Application
Evaluating a multi-layered structure for voids
- Publication number 20050112788
- Publication date May 26, 2005
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Application
Identifying defects in a conductive structure of a wafer, based on...
- Publication number 20030165178
- Publication date Sep 4, 2003
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for measuring a property of a layer in a multi...
- Publication number 20030164946
- Publication date Sep 4, 2003
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Application
Evaluating a multi-layered structure for voids
- Publication number 20020125905
- Publication date Sep 12, 2002
- Peter G. Borden
- G01 - MEASURING TESTING