Ji-Shyang Nieh

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Hsin-Chu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Chip pad resistant to antenna effect and method
- Patent number 8,872,303
- Issue date Oct 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wu-Te Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip pad resistant to antenna effect and method
- Patent number 8,470,705
- Issue date Jun 25, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wu-Te Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring plasma induced damage during semiconductor wafer processes
- Patent number 8,193,824
- Issue date Jun 5, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wu-Der Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip pad resistant to antenna effect and method
- Patent number 8,148,797
- Issue date Apr 3, 2012
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wu-Te Weng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Chip Pad Resistant to Antenna Effect and Method
- Publication number 20130277860
- Publication date Oct 24, 2013
- Wu-Te Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chip Pad Resistant to Antenna Effect and Method
- Publication number 20120156870
- Publication date Jun 21, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wu-Te Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Chip Pad Resistant to Antenna Effect and Method
- Publication number 20090321871
- Publication date Dec 31, 2009
- Wu-Te Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monitoring Plasma Induced Damage During Semiconductor Wafer Processes
- Publication number 20090281745
- Publication date Nov 12, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Wu Der Weng
- H01 - BASIC ELECTRIC ELEMENTS