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Jia-Hwang Chang
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Cupertino, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Low voltage one transistor flash EEPROM cell using Fowler-Nordheim...
Patent number
5,689,459
Issue date
Nov 18, 1997
Rohm Corporation
Shang-De Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Low voltage one transistor flash eeprom cell using fowler-nordheim...
Patent number
5,687,120
Issue date
Nov 11, 1997
Rohn Corporation
Shang-De Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Low voltage one transistor flash EEPROM cell using Fowler-Nordheim...
Patent number
5,615,147
Issue date
Mar 25, 1997
Rohm Corporation
Shang-De Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Low voltage one transistor flash EEPROM cell using Fowler-Nordheim...
Patent number
5,587,947
Issue date
Dec 24, 1996
Rohm Corporation
Shang-De Chang
G11 - INFORMATION STORAGE
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,432,441
Issue date
Jul 11, 1995
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,365,165
Issue date
Nov 15, 1994
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,341,092
Issue date
Aug 23, 1994
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,309,091
Issue date
May 3, 1994
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,223,792
Issue date
Jun 29, 1993
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,208,530
Issue date
May 4, 1993
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING
Information
Patent Grant
Testability architecture and techniques for programmable interconne...
Patent number
5,083,083
Issue date
Jan 21, 1992
Actel Corporation
Khaled A. El-Ayat
G01 - MEASURING TESTING