Jia-Min WANG

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
API-based pattern-controlled test on an ATE
- Patent number 9,989,591
- Issue date Jun 5, 2018
- Advantest Corporation
- Liang Ge
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
API-BASED PATTERN-CONTROLLED TEST ON AN ATE
- Publication number 20150293174
- Publication date Oct 15, 2015
- Advantest Corporation
- Liang GE
- G01 - MEASURING TESTING