JIA-MING GUO

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HSINCHU, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting defective logic devices
- Patent number 11,675,004
- Issue date Jun 13, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Circuit screening system and circuit screening method
- Patent number 11,500,016
- Issue date Nov 15, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Che Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES
- Publication number 20230273257
- Publication date Aug 31, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
- Publication number 20220178998
- Publication date Jun 9, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES
- Publication number 20210356521
- Publication date Nov 18, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-CHE WU
- G01 - MEASURING TESTING