Jia-Rui Hu

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Taichung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method of extracting defects
- Patent number 10,163,733
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Rui Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for extracting systematic defects
- Patent number 9,418,199
- Issue date Aug 16, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING
Information Patent Grant
Extraction of systematic defects
- Patent number 9,201,022
- Issue date Dec 1, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for extracting systematic defects
- Patent number 8,984,450
- Issue date Mar 17, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting method for forming semiconductor device
- Patent number 8,755,045
- Issue date Jun 17, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jyuh-Fuh Lin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXTRACTING DEFECTS
- Publication number 20170345725
- Publication date Nov 30, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Jia-Rui HU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXTRACTING SYSTEMATIC DEFECTS
- Publication number 20150254394
- Publication date Sep 10, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Extracting Systematic Defects
- Publication number 20140282334
- Publication date Sep 18, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING
Information Patent Application
DETECTING METHOD FOR FORMING SEMICONDUCTOR DEVICE
- Publication number 20130176558
- Publication date Jul 11, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jyuh-Fuh Lin
- G01 - MEASURING TESTING
Information Patent Application
EXTRACTION OF SYSTEMATIC DEFECTS
- Publication number 20120308112
- Publication date Dec 6, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING