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Kaohsiung City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Memory device
Patent number
12,148,808
Issue date
Nov 19, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Yu-Chu Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Memory device
Patent number
11,830,918
Issue date
Nov 28, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Yu-Chu Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Memory device and method for manufacturing the same
Patent number
11,362,185
Issue date
Jun 14, 2022
Taiwan Semiconductor Manufacturing Co., Ltd
Yu-Chu Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor devices with self-heating structures, methods of manu...
Patent number
9,076,751
Issue date
Jul 7, 2015
Taiwan Semiconductor Manufacturing Company, Ltd.
Jia Yang Ko
G01 - MEASURING TESTING
Information
Patent Grant
Nitrogen passivation of source and drain recesses
Patent number
8,659,089
Issue date
Feb 25, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Jia-Yang Ko
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MEMORY DEVICE
Publication number
20240030302
Publication date
Jan 25, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Yu-Chu LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEMORY DEVICE
Publication number
20220302273
Publication date
Sep 22, 2022
Taiwan Semiconductor Manufacturing Co., Ltd.
Yu-Chu LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20210226026
Publication date
Jul 22, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Yu-Chu LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NITROGEN PASSIVATION OF SOURCE AND DRAIN RECESSES
Publication number
20130087857
Publication date
Apr 11, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Jia-Yang Ko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Devices with Self-heating Structures, Methods of Manu...
Publication number
20130049781
Publication date
Feb 28, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Jia Yang Ko
G01 - MEASURING TESTING