Jiaguang Sun

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Capacity expansion method and capacity expansion system based on du...
- Patent number 11,467,754
- Issue date Oct 11, 2022
- Tsinghua University
- Jianmin Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan-based self-test structure and method using weighted scan-enabl...
- Patent number 7,526,696
- Issue date Apr 28, 2009
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing pin overhead in non-scan design for testability
- Patent number 7,051,302
- Issue date May 23, 2006
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Cost-effective scan architecture and a test application scheme for...
- Patent number 6,959,426
- Issue date Oct 25, 2005
- Tsinghua University
- Dong Xiang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COLUMNAR STORAGE AND QUERY METHOD AND SYSTEM FOR TIME SERIES DATA
- Publication number 20210157811
- Publication date May 27, 2021
- TSINGHUA UNIVERSITY
- Jianmin WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAPACITY EXPANSION METHOD AND CAPACITY EXPANSION SYSTEM BASED ON DU...
- Publication number 20210089214
- Publication date Mar 25, 2021
- TSINGHUA UNIVERSITY
- Jianmin WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scan-based self-test structure and method using weighted scan-enabl...
- Publication number 20060236182
- Publication date Oct 19, 2006
- TSINGHUA UNIVERSITY
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
Cost-effective scan architecture and a test application scheme for...
- Publication number 20040153978
- Publication date Aug 5, 2004
- Dong Xiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for reducing pin overhead in non-scan design for testability
- Publication number 20040130313
- Publication date Jul 8, 2004
- Dong Xiang
- G01 - MEASURING TESTING