Jiahong WU

Person

Yokkaichi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Collecting device and collecting method
- Patent number 11,923,138
- Issue date Mar 5, 2024
- Kioxia Corporation
- Sho Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing silicon substrate
- Patent number 11,837,510
- Issue date Dec 5, 2023
- Kioxia Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 11,640,903
- Issue date May 2, 2023
- Kioxia Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 11,607,750
- Issue date Mar 21, 2023
- Kioxia Corporation
- Jiahong Wu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Analysis pretreatment device
- Patent number 10,962,519
- Issue date Mar 30, 2021
- TOSHIBA MEMORY CORPORATION
- Jiahong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Metal collection solution and method of analyzing substrate contami...
- Patent number 9,658,203
- Issue date May 23, 2017
- Kabushiki Kaisha Toshiba
- Jiahong Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMPURITY RECOVERY DEVICE AND IMPURITY RECOVERY METHOD
- Publication number 20240307929
- Publication date Sep 19, 2024
- KIOXIA Corporation
- Jiahong WU
- B08 - CLEANING
Information Patent Application
COLLECTING DEVICE AND COLLECTING METHOD
- Publication number 20230070820
- Publication date Mar 9, 2023
- KIOXIA Corporation
- Sho KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20220277946
- Publication date Sep 1, 2022
- KIOXIA Corporation
- Jiahong WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING SILICON SUBSTRATE
- Publication number 20210118751
- Publication date Apr 22, 2021
- KIOXIA Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20200391328
- Publication date Dec 17, 2020
- KIOXIA Corporation
- Jiahong WU
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Analysis Pretreatment Device
- Publication number 20170072378
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Jiahong WU
- G01 - MEASURING TESTING
Information Patent Application
METAL COLLECTION SOLUTION AND METHOD OF ANALYZING SUBSTRATE CONTAMI...
- Publication number 20160209389
- Publication date Jul 21, 2016
- KABUSHIKI KAISHA TOSHIBA
- Jiahong WU
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Collecting device and collecting method

Method for analyzing silicon substrate

Analysis apparatus and analysis method

Analysis apparatus and analysis method

Analysis pretreatment device

Metal collection solution and method of analyzing substrate contami...

Patents Applicationslast 30 patents

IMPURITY RECOVERY DEVICE AND IMPURITY RECOVERY METHOD

COLLECTING DEVICE AND COLLECTING METHOD

ANALYSIS APPARATUS AND ANALYSIS METHOD

METHOD FOR ANALYZING SILICON SUBSTRATE

ANALYSIS APPARATUS AND ANALYSIS METHOD

Analysis Pretreatment Device

METAL COLLECTION SOLUTION AND METHOD OF ANALYZING SUBSTRATE CONTAMI...