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last 30 patents
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Patent Grant
Substrate inspection device and substrate inspection method
Patent number
9,784,676
Issue date
Oct 10, 2017
BOE TECHNOLOGY GROUP CO., LTD
Peng Luo
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD
Publication number
20160258866
Publication date
Sep 8, 2016
BOE TECHNOLOGY GROUP CO., LTD.
Peng LUO
G01 - MEASURING TESTING