Jiajun Luo

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Power device and fabrication method thereof
- Patent number 12,119,199
- Issue date Oct 15, 2024
- INSTITUTE OF MICROELECTRONICS OF THE CHINESE ACADEMY OF SCIENCES
- Fazhan Zhao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
STI stress effect modeling method and device of an MOS device
- Patent number 10,176,287
- Issue date Jan 8, 2019
- The Institute of Microelectronics of Chinese Academy of Science
- Jianhui Bu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SOI MOS device modeling method
- Patent number 9,626,467
- Issue date Apr 18, 2017
- Institute of Microelectronics, Chinese Academy of Sciences
- Jianhui Bu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving anti-radiation performance of SOI structure
- Patent number 9,111,995
- Issue date Aug 18, 2015
- Institute of Microelectronics, Chinese Academy of Sciences
- Yinxue Lv
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
POWER DEVICE AND FABRICATION METHOD THEREOF
- Publication number 20220328275
- Publication date Oct 13, 2022
- INSTITUTE OF MICROELECTRONICS OF THE CHINESE ACADEMY OF SCIENCES
- Fazhan ZHAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STI STRESS EFFECT MODELING METHOD AND DEVICE OF AN MOS DEVICE
- Publication number 20160259876
- Publication date Sep 8, 2016
- THE INSTITUTE OF MICROELECTRONICS OF CHINESE ACADEMY OF SCIENCES
- Jianhui Bu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING PN JUNCTION DEPTH
- Publication number 20150177312
- Publication date Jun 25, 2015
- Institute of Microelectronics, Chinese Academy of Sciences
- Jianhui Bu
- G01 - MEASURING TESTING
Information Patent Application
SOI MOS DEVICE MODELING METHOD
- Publication number 20150178429
- Publication date Jun 25, 2015
- Institute of Microelectronics, Chinese Academy of of Sciences
- Jianhui Bu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20150170915
- Publication date Jun 18, 2015
- Institute of Microelectroncis, Chinese Academy of Science
- Jinshun Bi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140349463
- Publication date Nov 27, 2014
- Yinxue Lv
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140239385
- Publication date Aug 28, 2014
- Institute of Microelectronics, Chinese Academy of Sciences
- Jinshun Bi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Frame Buffer Pixel Circuit of Liquid Crystal on Silicon Display Device
- Publication number 20130069966
- Publication date Mar 21, 2013
- Bohua Zhao
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Power device and fabrication method thereof

STI stress effect modeling method and device of an MOS device

SOI MOS device modeling method

Method for improving anti-radiation performance of SOI structure

Patents Applicationslast 30 patents

POWER DEVICE AND FABRICATION METHOD THEREOF

STI STRESS EFFECT MODELING METHOD AND DEVICE OF AN MOS DEVICE

METHOD FOR DETERMINING PN JUNCTION DEPTH

SOI MOS DEVICE MODELING METHOD

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURING THE SAME

Frame Buffer Pixel Circuit of Liquid Crystal on Silicon Display Device