Jian Cao

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Shijiazhuang, CN

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Patents Grantslast 30 patents

Information Patent Grant
On-wafer S-parameter calibration method
- Patent number 11,340,286
- Issue date May 24, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS
- Aihua Wu
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method, system and device of on-wafer s parameter of ve...
- Patent number 11,275,103
- Issue date Mar 15, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NEW ON-WAFER S-PARAMETER CALIBRATION METHOD
- Publication number 20220003811
- Publication date Jan 6, 2022
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Aihua WU
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD, SYSTEM AND DEVICE OF ON-WAFER S PARAMETER OF VE...
- Publication number 20210003622
- Publication date Jan 7, 2021
- THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Yibang Wang
- G01 - MEASURING TESTING