Jian-Chang Lin

Follow

Person

Tainan County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis method for semiconductor device
- Patent number 8,093,074
- Issue date Jan 10, 2012
- United Microelectronics Corp.
- Chih-Chung Chang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analysis method for semiconductor device
- Publication number 20110151597
- Publication date Jun 23, 2011
- United Microelectronics Corp.
- Chih-Chung Chang
- G01 - MEASURING TESTING