Jian Ding

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Hackettstown, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Calibration of semiconductor metrology systems
- Patent number 10,173,249
- Issue date Jan 8, 2019
- Rudolph Technologies, Inc.
- Jian Ding
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION OF SEMICONDUCTOR METROLOGY SYSTEMS
- Publication number 20160101445
- Publication date Apr 14, 2016
- Rudolph Technologies, Inc.
- Jian Ding
- B08 - CLEANING