Jian Ding

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Methuen, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Low contrast non-referential defect detection
- Patent number 12,354,254
- Issue date Jul 8, 2025
- Onto Innovation Inc.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus to characterize substrates and films
- Patent number 12,235,091
- Issue date Feb 25, 2025
- Onto Innovation Inc.
- Jian Ding
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
BLUR REDUCTION TECHNIQUES FOR SEMICONDUCTOR INSPECTION
- Publication number 20250102822
- Publication date Mar 27, 2025
- ONTO INNOVATION INC.
- Jian Ding
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS TO CHARACTERIZE SUBSTRATES AND FILMS
- Publication number 20240027186
- Publication date Jan 25, 2024
- ONTO INNOVATION INC.
- Jian Ding
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC-PATTERN BACKGROUND REMOVAL
- Publication number 20240020819
- Publication date Jan 18, 2024
- ONTO INNOVATION INC.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH RESOLUTION MULTI-FIELD-OF-VIEW IMAGING SYSTEM
- Publication number 20230057470
- Publication date Feb 23, 2023
- ONTO INNOVATION INC.
- John A. Tejada
- G02 - OPTICS
Information Patent Application
LOW CONTRAST NON-REFERENTIAL DEFECT DETECTION
- Publication number 20230012917
- Publication date Jan 19, 2023
- ONTO INNOVATION INC.
- Roman S. Basistyy
- G06 - COMPUTING CALCULATING COUNTING