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Jian Fang
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West Windsor, NJ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Facial recognition for masked individuals
Patent number
11,710,346
Issue date
Jul 25, 2023
NEC Corporation
Manmohan Chandraker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multilayer coding method for distributed physical measurements
Patent number
10,739,228
Issue date
Aug 11, 2020
NEC Corporation
Yaowen Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
GUNSHOT DETECTION VIA CLASSIFICATION USING DEEP LEARNING AND FIBER...
Publication number
20230400350
Publication date
Dec 14, 2023
NEC Laboratories America, Inc.
Shaobo HAN
F41 - WEAPONS
Information
Patent Application
COLORLESS DISTRIBUTED FIBER OPTIC SENSING / DISTRIBUTED VIBRATION S...
Publication number
20230152151
Publication date
May 18, 2023
NEC Laboratories America, Inc.
Yaowen LI
G01 - MEASURING TESTING
Information
Patent Application
FEW-MODE RAYLEIGH-BASED DISTRIBUTED FIBER SENSOR FOR SIMULTANEOUS T...
Publication number
20230125375
Publication date
Apr 27, 2023
NEC Laboratories America, Inc.
Jian FANG
G01 - MEASURING TESTING
Information
Patent Application
PHYSIMETRIC-BASED DATA SECURITY FOR CODED DISTRIBUTED TEMPERATURE S...
Publication number
20220247562
Publication date
Aug 4, 2022
NEC Laboratories America, Inc.
Qiang WANG
G01 - MEASURING TESTING
Information
Patent Application
FACIAL RECOGNITION FOR MASKED INDIVIDUALS
Publication number
20210374468
Publication date
Dec 2, 2021
NEC Laboratories America, Inc.
Manmohan Chandraker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
JOINT WAVELET DENOISING FOR DISTRIBUTED TEMPERATURE SENSING
Publication number
20210356332
Publication date
Nov 18, 2021
NEC Laboratories America, Inc.
Jian FANG
G01 - MEASURING TESTING
Information
Patent Application
BIPOLAR CYCLIC CODING FOR BRILLOUIN OPTICAL TIME DOMAIN ANALYSIS
Publication number
20210181059
Publication date
Jun 17, 2021
NEC Laboratories America, Inc.
Jian FANG
G01 - MEASURING TESTING
Information
Patent Application
MULTILAYER CODING METHOD FOR DISTRIBUTED PHYSICAL MEASUREMENTS
Publication number
20190234832
Publication date
Aug 1, 2019
NEC Laboratories America, Inc.
Yaowen Li
G01 - MEASURING TESTING