Jian Ge

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Gainesville, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Simultaneous refractive index and thickness measurements with a mon...
- Patent number 9,696,138
- Issue date Jul 4, 2017
- University of Florida Research Foundation, Inc.
- Xiaoke Wan
- G01 - MEASURING TESTING
Information Patent Grant
High-precision monolithic optical assemblies and methods for fabric...
- Patent number 8,659,845
- Issue date Feb 25, 2014
- University of Florida Research Foundation, Inc.
- Xiaoke Wan
- G02 - OPTICS
Information Patent Grant
Stable monolithic interferometer for wavelenghth calibration
- Patent number 8,570,524
- Issue date Oct 29, 2013
- University of Florida Research Foundation, Inc.
- Xiaoke Wan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIMULTANEOUS REFRACTIVE INDEX AND THICKNESS MEASUREMENTS WITH A MON...
- Publication number 20140168637
- Publication date Jun 19, 2014
- University of Florida Research Foundation, Inc.
- Xiaoke Wan
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PRECISION MONOLITHIC OPTICAL ASSEMBLIES AND METHODS FOR FABRIC...
- Publication number 20110286100
- Publication date Nov 24, 2011
- Xiaoke Wan
- G02 - OPTICS
Information Patent Application
UNIVERSAL WAVELENGTH CALIBRATION SOURCE USING A STABLE MONOLITHIC I...
- Publication number 20110032529
- Publication date Feb 10, 2011
- University of Florida Research Foundation, Inc.
- Xiaoke WAN
- G01 - MEASURING TESTING