Jian-Ping Zhuang

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 6,267,005
- Issue date Jul 31, 2001
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for locating a feature of a surface
- Patent number 5,866,806
- Issue date Feb 2, 1999
- KLA-Tencor Corporation
- Amin Samsavar
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING