Jian Shi

Person

Goleta, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,197,596
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,995,765
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,810,713
- Issue date Nov 7, 2017
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,523,707
- Issue date Dec 20, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,291,640
- Issue date Mar 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,274,139
- Issue date Mar 1, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 9,244,096
- Issue date Jan 26, 2016
- Bruke Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Closed loop controller and method for fast scanning probe microscopy
- Patent number 8,904,560
- Issue date Dec 2, 2014
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 8,650,660
- Issue date Feb 11, 2014
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 8,646,109
- Issue date Feb 4, 2014
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Grant
Fast-scanning SPM and method of operating same
- Patent number 7,770,231
- Issue date Aug 3, 2010
- Veeco Instruments, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever free-decay measurement system with coherent averaging
- Patent number 7,555,940
- Issue date Jul 7, 2009
- Veeco Instruments, Inc.
- Chanmin Quanmin Su
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20160274144
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
- Publication number 20160266166
- Publication date Sep 15, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160258979
- Publication date Sep 8, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Closed Loop Controller and Method for Fast Scanning Probe Microscopy
- Publication number 20150198630
- Publication date Jul 16, 2015
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20140230103
- Publication date Aug 14, 2014
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20140223615
- Publication date Aug 7, 2014
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20120131702
- Publication date May 24, 2012
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE
- Publication number 20110167524
- Publication date Jul 7, 2011
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Fast-Scanning SPM and Method of Operating Same
- Publication number 20090032706
- Publication date Feb 5, 2009
- Veeco Instruments Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Application
Closed loop controller and method for fast scanning probe microscopy
- Publication number 20080277582
- Publication date Nov 13, 2008
- Veeco Instruments Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Cantilever free-decay measurement system with coherent averaging
- Publication number 20080022759
- Publication date Jan 31, 2008
- Veeco Instruments, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND METHOD FOR A SCANNING PROBE MICROSCOPE
- Publication number 20060260388
- Publication date Nov 23, 2006
- Chanmin Su
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Closed loop controller and method for fast scanning probe microscopy

Closed loop controller and method for fast scanning probe microscopy

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Fast-scanning SPM and method of operating same

Cantilever free-decay measurement system with coherent averaging

Patents Applicationslast 30 patents

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Closed Loop Controller and Method for Fast Scanning Probe Microscopy

Method and Apparatus of Operating a Scanning Probe Microscope

Closed Loop Controller and Method for Fast Scanning Probe Microscopy

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE

Fast-Scanning SPM and Method of Operating Same

Closed loop controller and method for fast scanning probe microscopy

Cantilever free-decay measurement system with coherent averaging

PROBE AND METHOD FOR A SCANNING PROBE MICROSCOPE