JIAN-SHING LUO

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TAOYUAN COUNTY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Sample stack structure and method for preparing the same
- Patent number 9,360,401
- Issue date Jun 7, 2016
- Inotera Memories, Inc.
- Jian-Shing Luo
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope specimen and method for preparing the same
- Patent number 8,481,968
- Issue date Jul 9, 2013
- Inotera Memories, Inc.
- Jian-Shing Luo
- G01 - MEASURING TESTING
Information Patent Grant
Preparation method for an electron tomography sample with embedded...
- Patent number 7,939,906
- Issue date May 10, 2011
- Inotera Memories, Inc.
- Jian-Shing Luo
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating sample membranes for transmission electron mi...
- Patent number 7,538,322
- Issue date May 26, 2009
- Inotera Memories, Inc.
- Jian-Shing Luo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE STACK STRUCTURE AND METHOD FOR PREPARING THE SAME
- Publication number 20160084742
- Publication date Mar 24, 2016
- INOTERA MEMORIES, INC.
- Jian-Shing Luo
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE SPECIMEN AND METHOD FOR PREPARING THE SAME
- Publication number 20110291008
- Publication date Dec 1, 2011
- Jian-Shing Luo
- G01 - MEASURING TESTING
Information Patent Application
PREPARATION METHOD FOR AN ELECTRON TOMOGRAPHY SAMPLE WITH EMBEDDED...
- Publication number 20100084555
- Publication date Apr 8, 2010
- INOTERA MEMORIES, INC.
- JIAN-SHING LUO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FABRICATING SAMPLE MEMBRANES FOR TRANSMISSION ELECTRON MI...
- Publication number 20080054179
- Publication date Mar 6, 2008
- INOTERA MEMORIES, INC.
- Jian-Shing Luo
- G01 - MEASURING TESTING