Jian Zhang

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Beam manipulation of advanced charge controller module in a charged...
- Patent number 12,217,927
- Issue date Feb 4, 2025
- ASML Netherlands B.V.
- Jian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-differential confocal tilt sensor for measuring level variatio...
- Patent number 12,142,456
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Jinmei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal-aided inspection by advanced charge controller module in a...
- Patent number 12,125,669
- Issue date Oct 22, 2024
- ASML Netherlands B.V.
- Ning Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and method
- Patent number 12,072,181
- Issue date Aug 27, 2024
- ASML Netherlands B.V.
- Yan Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical objective lens
- Patent number 11,808,930
- Issue date Nov 7, 2023
- ASML Netherlands B.V.
- Jian Zhang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Thermal-aided inspection by advanced charge controller module in a...
- Patent number 11,728,131
- Issue date Aug 15, 2023
- ASML Netherlands B.V.
- Ning Ye
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical system with compensation lens
- Patent number 11,682,538
- Issue date Jun 20, 2023
- ASML Netherlands B.V.
- Jian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Learning skills from video demonstrations
- Patent number 11,524,401
- Issue date Dec 13, 2022
- Apple Inc.
- Jian Zhang
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Optical height detection system
- Patent number 11,521,826
- Issue date Dec 6, 2022
- ASML Netherlands B.V.
- Jian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for an advanced charged controller for wafer i...
- Patent number 11,482,399
- Issue date Oct 25, 2022
- ASML Netherlands B.V.
- Jian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-motion generator
- Patent number 11,430,308
- Issue date Aug 30, 2022
- Apple Inc.
- Jian Zhang
- G08 - SIGNALLING
Information Patent Grant
Method and device for improved localization and mapping
- Patent number 11,189,052
- Issue date Nov 30, 2021
- Apple Inc.
- Emilio Parisotto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical system with compensation lens
- Patent number 11,183,360
- Issue date Nov 23, 2021
- ASML Netherlands B.V.
- Jian Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for improved localization and mapping
- Patent number 10,776,948
- Issue date Sep 15, 2020
- Apple Inc.
- Emilio Parisotto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Learning based defect classification
- Patent number 10,223,615
- Issue date Mar 5, 2019
- Dongfang Jingyuan Electron Limited
- Weimin Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for calibrating charge-regulating module
- Patent number 9,536,697
- Issue date Jan 3, 2017
- Hermes Microvision Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase detector
- Patent number 8,698,070
- Issue date Apr 15, 2014
- Hermes-Microvision, Inc.
- Yi-Xiang Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20250037966
- Publication date Jan 30, 2025
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20240369356
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Estimating Resource Costs for Computing Tasks for a Reconfigurable...
- Publication number 20240086235
- Publication date Mar 14, 2024
- SambaNova Systems, Inc.
- Tianxiao JIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Virtual Reality Hardware
- Publication number 20240012243
- Publication date Jan 11, 2024
- Meta Platforms Technologies, LLC
- Charlene Mary ATLAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A...
- Publication number 20230395352
- Publication date Dec 7, 2023
- ASML NETHERLANDS B.V.
- Ning YE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTU...
- Publication number 20230335374
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Estimating Throughput for Placement Graphs for a Reconfigurable Dat...
- Publication number 20230162032
- Publication date May 25, 2023
- SambaNova Systems, Inc.
- Etash Kumar GUHA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVELING SENSOR IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20230096657
- Publication date Mar 30, 2023
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE INSPECTION SYSTEM AND METHOD USING MULTI-WAVELENGT...
- Publication number 20220375715
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM MANIPULATION OF ADVANCED CHARGE CONTROLLER MODULE IN A CHARGED...
- Publication number 20220351932
- Publication date Nov 3, 2022
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...
- Publication number 20220328283
- Publication date Oct 13, 2022
- ASML NETHERLANDS B.V.
- Jinmei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION
- Publication number 20220270849
- Publication date Aug 25, 2022
- ASML NETHERLANDS B.V.
- Jun JIANG
- G01 - MEASURING TESTING
Information Patent Application
THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A...
- Publication number 20220189733
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Ning YE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND METHOD
- Publication number 20220107176
- Publication date Apr 7, 2022
- ASML NETHERLANDS B.V.
- Yan WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SYSTEM WITH COMPENSATION LENS
- Publication number 20220084780
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MONITORING BEAM PROFILE AND POWER
- Publication number 20220042935
- Publication date Feb 10, 2022
- ASML NETHERLANDS B.V.
- Jian ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-SOURCE ILLUMINATION UNIT AND METHOD OF OPERATING THE SAME
- Publication number 20210396683
- Publication date Dec 23, 2021
- ASML NETHERLANDS B.V.
- Jian ZHANG
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL REALITY SYSTEMS AND METHODS
- Publication number 20210325683
- Publication date Oct 21, 2021
- Facebook Technologies, LLC
- Christina Yee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR IMPROVED LOCALIZATION AND MAPPING
- Publication number 20200372675
- Publication date Nov 26, 2020
- Apple Inc.
- Emilio Parisotto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL SYSTEM WITH COMPENSATION LENS
- Publication number 20200294762
- Publication date Sep 17, 2020
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL HEIGHT DETECTION SYSTEM
- Publication number 20200279715
- Publication date Sep 3, 2020
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL OBJECTIVE LENS
- Publication number 20200278524
- Publication date Sep 3, 2020
- ASML NETHERLANDS B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR AN ADVANCED CHARGED CONTROLLER FOR WAFER I...
- Publication number 20200273662
- Publication date Aug 27, 2020
- ASML Netherlands B.V.
- Jian ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Learning Based Defect Classification
- Publication number 20180060702
- Publication date Mar 1, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Weimin Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Calibrating Charge-Regulating Module
- Publication number 20160343534
- Publication date Nov 24, 2016
- HERMES MICROVISION INC.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE DETECTOR
- Publication number 20130094017
- Publication date Apr 18, 2013
- Yi-Xiang WANG
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Beam manipulation of advanced charge controller module in a charged...

Self-differential confocal tilt sensor for measuring level variatio...

Thermal-aided inspection by advanced charge controller module in a...

Method and apparatus for monitoring beam profile and power

Inspection apparatus and method

Optical objective lens

Thermal-aided inspection by advanced charge controller module in a...

Optical system with compensation lens

Learning skills from video demonstrations

Optical height detection system

Method and apparatus for an advanced charged controller for wafer i...

Multi-motion generator

Method and device for improved localization and mapping

Optical system with compensation lens

Method and device for improved localization and mapping

Learning based defect classification

System and method for calibrating charge-regulating module

Phase detector

Patents Applicationslast 30 patents

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

INSPECTION APPARATUS AND METHOD

Estimating Resource Costs for Computing Tasks for a Reconfigurable...

Virtual Reality Hardware

THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A...

SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTU...

Estimating Throughput for Placement Graphs for a Reconfigurable Dat...

LEVELING SENSOR IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

CHARGED PARTICLE INSPECTION SYSTEM AND METHOD USING MULTI-WAVELENGT...

BEAM MANIPULATION OF ADVANCED CHARGE CONTROLLER MODULE IN A CHARGED...

SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATIO...

PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION

THERMAL-AIDED INSPECTION BY ADVANCED CHARGE CONTROLLER MODULE IN A...

INSPECTION APPARATUS AND METHOD

OPTICAL SYSTEM WITH COMPENSATION LENS

METHOD AND APPARATUS FOR MONITORING BEAM PROFILE AND POWER

MULTI-SOURCE ILLUMINATION UNIT AND METHOD OF OPERATING THE SAME

VIRTUAL REALITY SYSTEMS AND METHODS

METHOD AND DEVICE FOR IMPROVED LOCALIZATION AND MAPPING

OPTICAL SYSTEM WITH COMPENSATION LENS

OPTICAL HEIGHT DETECTION SYSTEM

OPTICAL OBJECTIVE LENS

METHOD AND APPARATUS FOR AN ADVANCED CHARGED CONTROLLER FOR WAFER I...

Learning Based Defect Classification

System and Method for Calibrating Charge-Regulating Module

PHASE DETECTOR