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Patents Grants
last 30 patents
Information
Patent Grant
Single-beam photothermal measurement apparatus and measurement meth...
Patent number
12,099,002
Issue date
Sep 24, 2024
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Shijie Liu
G01 - MEASURING TESTING
Information
Patent Grant
Method for rapid growth of long seed KDP-type crystals
Patent number
11,486,053
Issue date
Nov 1, 2022
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Bin Wang
C30 - CRYSTAL GROWTH
Information
Patent Grant
Surface defect measuring apparatus and method by microscopic scatte...
Patent number
11,175,220
Issue date
Nov 16, 2021
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Jianda Shao
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring in-situ time-resolved X-ray absorpt...
Patent number
10,969,348
Issue date
Apr 6, 2021
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Jianda Shao
G01 - MEASURING TESTING
Information
Patent Grant
Method for limiting growth of KDP-type crystals with a long seed
Patent number
10,822,715
Issue date
Nov 3, 2020
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Hongji Qi
C30 - CRYSTAL GROWTH
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR GROWING LONG-SEED DKDP CRYSTAL BY TWO-DIMENSIONAL MOTION
Publication number
20230227995
Publication date
Jul 20, 2023
Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
Duanyang CHEN
C30 - CRYSTAL GROWTH
Information
Patent Application
SINGLE-BEAM PHOTOTHERMAL MEASUREMENT APPARATUS AND MEASUREMENT METH...
Publication number
20220120675
Publication date
Apr 21, 2022
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Shijie LIU
G02 - OPTICS
Information
Patent Application
PYRAMIDAL GROWTH METHOD FOR LONG-SEED KDP-TYPE CRYSTAL
Publication number
20210148003
Publication date
May 20, 2021
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Bin WANG
G02 - OPTICS
Information
Patent Application
SURFACE DEFECT MEASURING APPARATUS AND METHOD BY MICROSCOPIC SCATTE...
Publication number
20210010927
Publication date
Jan 14, 2021
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Jianda Shao
G02 - OPTICS
Information
Patent Application
DEVICE AND METHOD FOR MEASURING IN-SITU TIME-RESOLVED X-RAY ABSORPT...
Publication number
20200003706
Publication date
Jan 2, 2020
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Jianda SHAO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR LIMITING GROWTH OF KDP-TYPE CRYSTALS WITH A LONG SEED
Publication number
20190136403
Publication date
May 9, 2019
Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
Hongji QI
C30 - CRYSTAL GROWTH