JIANFENG PAN

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
In-chip static-current device failure detecting methods and apparatus
- Patent number 9,606,173
- Issue date Mar 28, 2017
- Semiconductor Manufacturing International (Beijing) Corporation
- Jianfeng Pan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IN-CHIP STATIC-CURRENT DEVICE FAILURE DETECTING METHODS AND APPARATUS
- Publication number 20150316601
- Publication date Nov 5, 2015
- Semiconductor Manufacturing International (Beijing) Corpor
- JIANFENG PAN
- G01 - MEASURING TESTING