Jianhong Zhu

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Metal capacitor design for improved reliability and good electrical...
- Patent number 9,818,816
- Issue date Nov 14, 2017
- GLOBALFOUNDRIES Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal capacitor design for improved reliability and good electrical...
- Patent number 8,357,584
- Issue date Jan 22, 2013
- GLOBALFOUNDRIES Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit system with triode
- Patent number 8,089,125
- Issue date Jan 3, 2012
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS structures with remote contacts and methods for fabricating the...
- Patent number 7,989,891
- Issue date Aug 2, 2011
- GLOBALFOUNDRIES Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for characterizing porous materials
- Patent number 7,807,213
- Issue date Oct 5, 2010
- Tokyo Electron Limited
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
MOS structures with contact projections for lower contact resistanc...
- Patent number 7,670,932
- Issue date Mar 2, 2010
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for characterization of low-k dielectric material damage
- Patent number 7,576,357
- Issue date Aug 18, 2009
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for treating a dielectric film
- Patent number 7,553,769
- Issue date Jun 30, 2009
- Tokyo Electron Limited
- Dorel Ioan Toma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for measuring electrical and dimensional characteris...
- Patent number 7,355,201
- Issue date Apr 8, 2008
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for treating a dielectric film
- Patent number 7,345,000
- Issue date Mar 18, 2008
- Tokyo Electron Limited
- Robert Kevwitch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure and method for measuring the resistance of line-end...
- Patent number 7,271,047
- Issue date Sep 18, 2007
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for characterizing porous materials
- Patent number 7,238,382
- Issue date Jul 3, 2007
- Tokyo Electron Limited
- Jianhong Zhu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METAL CAPACITOR DESIGN FOR IMPROVED RELIABILITY AND GOOD ELECTRICAL...
- Publication number 20130105944
- Publication date May 2, 2013
- GLOBALFOUNDRIES INC.
- Jianhong ZHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL CAPACITOR DESIGN FOR IMPROVED RELIABILITY AND GOOD ELECTRICAL...
- Publication number 20110108949
- Publication date May 12, 2011
- GLOBALFOUNDRIES INC.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS STRUCTURES WITH CONTACT PROJECTIONS FOR LOWER CONTACT RESISTANC...
- Publication number 20080308879
- Publication date Dec 18, 2008
- Advanced Micro Devices, Inc.
- Jianhong ZHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT SYSTEM WITH TRIODE
- Publication number 20080303089
- Publication date Dec 11, 2008
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS STRUCTURES WITH REMOTE CONTACTS AND METHODS FOR FABRICATING THE...
- Publication number 20080296682
- Publication date Dec 4, 2008
- Advanced Micro Devices, Inc.
- Jianhong ZHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR TREATING A DIELECTRIC FILM
- Publication number 20080076262
- Publication date Mar 27, 2008
- TOKYO ELECTRON LIMITED
- Robert Kevwitch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR MEASURING ELECTRICAL AND DIMENSIONAL CHARACTERIS...
- Publication number 20070296444
- Publication date Dec 27, 2007
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING POROUS MATERIALS
- Publication number 20070190232
- Publication date Aug 16, 2007
- TOKYO ELECTRON LIMITED
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Application
Method and system for characterizing porous materials
- Publication number 20060024849
- Publication date Feb 2, 2006
- TOKYO ELECTRON LIMITED
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Application
Method and system for treating a dielectric film
- Publication number 20050215072
- Publication date Sep 29, 2005
- TOKYO ELECTRON LIMITED
- Robert Kevwitch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for treating a dielectric film
- Publication number 20050077597
- Publication date Apr 14, 2005
- TOKYO ELECTRON LIMITED
- Dorel Ioan Toma
- H01 - BASIC ELECTRIC ELEMENTS

Jianhong Zhu

Person

Patents Grantslast 30 patents

Metal capacitor design for improved reliability and good electrical...

Metal capacitor design for improved reliability and good electrical...

Integrated circuit system with triode

MOS structures with remote contacts and methods for fabricating the...

Method and system for characterizing porous materials

MOS structures with contact projections for lower contact resistanc...

System for characterization of low-k dielectric material damage

Method for treating a dielectric film

Test structure for measuring electrical and dimensional characteris...

Method and system for treating a dielectric film

Test structure and method for measuring the resistance of line-end...

Method and system for characterizing porous materials

Patents Applicationslast 30 patents

METAL CAPACITOR DESIGN FOR IMPROVED RELIABILITY AND GOOD ELECTRICAL...

METAL CAPACITOR DESIGN FOR IMPROVED RELIABILITY AND GOOD ELECTRICAL...

MOS STRUCTURES WITH CONTACT PROJECTIONS FOR LOWER CONTACT RESISTANC...

INTEGRATED CIRCUIT SYSTEM WITH TRIODE

MOS STRUCTURES WITH REMOTE CONTACTS AND METHODS FOR FABRICATING THE...

METHOD AND SYSTEM FOR TREATING A DIELECTRIC FILM

TEST STRUCTURE FOR MEASURING ELECTRICAL AND DIMENSIONAL CHARACTERIS...

METHOD AND SYSTEM FOR CHARACTERIZING POROUS MATERIALS

Method and system for characterizing porous materials

Method and system for treating a dielectric film

Method and system for treating a dielectric film