Jianli He

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Goleta, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20130276174
- Publication date Oct 17, 2013
- Chunzeng Li
- B82 - NANO-TECHNOLOGY