Jianming Zhou

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Lioning, CN

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Patents Grantslast 30 patents

Information Patent Grant
Integrated-circuitry overlay alignment mark, a substrate comprising...
- Patent number 11,075,169
- Issue date Jul 27, 2021
- Micron Technology, Inc.
- Denzil S. Frost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of alignment marking semiconductor wafers, and semiconducto...
- Patent number 10,756,022
- Issue date Aug 25, 2020
- Micron Technology, Inc.
- Richard T. Housley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of alignment marking semiconductor wafers, and semiconducto...
- Patent number 10,461,038
- Issue date Oct 29, 2019
- Micron Technology, Inc.
- Richard T. Housley
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Integrated-Circuitry Overlay Alignment Mark, A Substrate Comprising...
- Publication number 20200203284
- Publication date Jun 25, 2020
- Micron Technology, Inc.
- Denzil S. Frost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Alignment Marking Semiconductor Wafers, and Semiconducto...
- Publication number 20200075500
- Publication date Mar 5, 2020
- Micron Technology, Inc.
- Richard T. Housley
- H01 - BASIC ELECTRIC ELEMENTS