Jiann-Neng Chen

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Newton, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Capacitively coupled re-referencing circuit with transient correction
- Patent number 6,515,512
- Issue date Feb 4, 2003
- Teradyne, Inc.
- Jiann-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated multi-channel analog test instrument architecture provid...
- Patent number 6,363,507
- Issue date Mar 26, 2002
- Teradyne, Inc.
- Eric L. Truebenbach
- G01 - MEASURING TESTING
Information Patent Grant
Relayless voltage measurement in automatic test equipment
- Patent number 6,194,910
- Issue date Feb 27, 2001
- Teradyne, Inc.
- Richard P. Davis
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board tester using magnetic induction
- Patent number 5,631,572
- Issue date May 20, 1997
- Teradyne, Inc.
- Timothy W. Sheen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring the length of an electrical line
- Patent number 4,734,637
- Issue date Mar 29, 1988
- Teradyne, Inc.
- Jiann-Neng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Circuitry for synchronizing a multiple channel circuit tester
- Patent number 4,660,197
- Issue date Apr 21, 1987
- Teradyne, Inc.
- Joseph F. Wrinn
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Capacitively coupled re-referencing circuit with transient correction
- Publication number 20020057107
- Publication date May 16, 2002
- Jiann-Neng Chen
- H03 - BASIC ELECTRONIC CIRCUITRY