Jiann-Rong Lee

Person

Webster, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring digital imager, package and wafe...
- Patent number 6,724,487
- Issue date Apr 20, 2004
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric-based external measurement system and method
- Patent number 6,624,891
- Issue date Sep 23, 2003
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for combined measurement of surface non-unifor...
- Patent number 6,614,534
- Issue date Sep 2, 2003
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and apparatus of an external digital camera imag...
- Patent number 6,587,209
- Issue date Jul 1, 2003
- Eastman Kodak Company
- Michael A. Marcus
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measurement method and apparatus of an external digital camera imag...
- Patent number 6,587,210
- Issue date Jul 1, 2003
- Eastman Kodak Company
- Michael A. Marcus
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for processing low coherence interferometric data
- Patent number 6,522,410
- Issue date Feb 18, 2003
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and apparatus of an external digital camera imag...
- Patent number 6,512,587
- Issue date Jan 28, 2003
- Eastman Kodak Company
- Michael A. Marcus
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for measuring material thickness profiles
- Patent number 6,067,161
- Issue date May 23, 2000
- Eastman Kodak Company
- Michael A. Marcus
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Method for measuring material thickness profiles
- Patent number 6,038,027
- Issue date Mar 14, 2000
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Method for processing interferometric measurement data
- Patent number 6,034,772
- Issue date Mar 7, 2000
- Eastman Kodak Company
- Michael A. Marcus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining the retardation of a material using non-cohe...
- Patent number 6,034,774
- Issue date Mar 7, 2000
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Grant
Digital camera image sensor positioning method including a non-cohe...
- Patent number 5,757,485
- Issue date May 26, 1998
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for measuring digital imager, package and wafe...
- Publication number 20030227632
- Publication date Dec 11, 2003
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Application
Interferometric-based external measurement system and method
- Publication number 20030076504
- Publication date Apr 24, 2003
- Eastman Kodak Company
- Michael A. Marcus
- G01 - MEASURING TESTING
Information Patent Application
Measurement method and apparatus of an external digital camera imag...
- Publication number 20030063287
- Publication date Apr 3, 2003
- Michael A. Marcus
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Measurement method and apparatus of an external digital camera imag...
- Publication number 20030063288
- Publication date Apr 3, 2003
- Michael A. Marcus
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Jiann-Rong Lee

Person

Patents Grantslast 30 patents

Apparatus and method for measuring digital imager, package and wafe...

Interferometric-based external measurement system and method

Method and apparatus for combined measurement of surface non-unifor...

Measurement method and apparatus of an external digital camera imag...

Measurement method and apparatus of an external digital camera imag...

Method for processing low coherence interferometric data

Measurement method and apparatus of an external digital camera imag...

Apparatus for measuring material thickness profiles

Method for measuring material thickness profiles

Method for processing interferometric measurement data

Method for determining the retardation of a material using non-cohe...

Digital camera image sensor positioning method including a non-cohe...

Patents Applicationslast 30 patents

Apparatus and method for measuring digital imager, package and wafe...

Interferometric-based external measurement system and method

Measurement method and apparatus of an external digital camera imag...

Measurement method and apparatus of an external digital camera imag...