Jianou Shi

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reflective compact lens for magneto-optic Kerr effect metrology system
- Patent number 12,164,093
- Issue date Dec 10, 2024
- Alex Zheng
- G02 - OPTICS
Information Patent Grant
Resistivity probes with curved portions
- Patent number 11,249,110
- Issue date Feb 15, 2022
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Magneto-optic Kerr effect metrology systems
- Patent number 11,043,239
- Issue date Jun 22, 2021
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Resistivity probe having movable needle bodies
- Patent number 10,514,391
- Issue date Dec 24, 2019
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Variable spacing four-point probe pin device and method
- Patent number 9,435,826
- Issue date Sep 6, 2016
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for nondestructively measuring concentration and...
- Patent number 8,804,106
- Issue date Aug 12, 2014
- KLA-Tencor Corporation
- NanChang Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining dielectric layer properties
- Patent number 8,004,290
- Issue date Aug 23, 2011
- KLA-Tencor Corporation
- Xiafang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for controlling deposition of a charge on a waf...
- Patent number 7,893,703
- Issue date Feb 22, 2011
- KLA-Tencor Technologies Corp.
- Jeffrey A. Rzepiela
- G01 - MEASURING TESTING
Information Patent Grant
Systems configured to perform a non-contact method for determining...
- Patent number 7,719,294
- Issue date May 18, 2010
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,538,333
- Issue date May 26, 2009
- KLA-Tencor Technologies Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of effective capacitance
- Patent number 7,525,304
- Issue date Apr 28, 2009
- KLA-Tencor Corporation
- Yiping Feng
- G01 - MEASURING TESTING
Information Patent Grant
Methods for imperfect insulating film electrical thickness/capacita...
- Patent number 7,397,254
- Issue date Jul 8, 2008
- KLA-Tencor Technologies Corp.
- Xiafang (Michelle) Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Corona based charge voltage measurement
- Patent number 7,345,306
- Issue date Mar 18, 2008
- KLA-Tencor Technologies Corporation
- Sergio Edelstein
- G01 - MEASURING TESTING
Information Patent Grant
Contactless charge measurement of product wafers and control of cor...
- Patent number 7,248,062
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corp.
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining one or more properties of a spe...
- Patent number 7,187,186
- Issue date Mar 6, 2007
- KLA-Tencor Technologies Corp.
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for using non-contact voltage sensors and coron...
- Patent number 7,110,238
- Issue date Sep 19, 2006
- KLA-Tencor Technologies Corp.
- Zhiwei (Steve) Xu
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact methods for measuring electrical thickness and determin...
- Patent number 7,103,484
- Issue date Sep 5, 2006
- KLA-Tencor Technologies Corp.
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Grant
Corona based charge voltage measurement
- Patent number 7,098,050
- Issue date Aug 29, 2006
- KLA-Tencor Technologies Corporation
- Sergio Edelstein
- G01 - MEASURING TESTING
Information Patent Grant
Methods for imperfect insulating film electrical thickness/capacita...
- Patent number 7,075,318
- Issue date Jul 11, 2006
- KLA-Tencor Technologies Corp.
- Xiafang (Michelle) Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining an electrical property of an in...
- Patent number 7,064,565
- Issue date Jun 20, 2006
- KLA-Tencor Technologies Corp.
- Zhiwei Xu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for using non-contact voltage sensors and coron...
- Patent number 6,909,291
- Issue date Jun 21, 2005
- KLA-Tencor Technologies Corp.
- Zhiwei (Steve) Xu
- G01 - MEASURING TESTING
Information Patent Grant
UV exposure for improving properties and adhesion of dielectric pol...
- Patent number 6,284,050
- Issue date Sep 4, 2001
- Novellus Systems, Inc.
- Jianou Shi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of minimizing reactive ion etch damage of organic insulating...
- Patent number 6,265,320
- Issue date Jul 24, 2001
- Novellus Systems, Inc.
- Jianou Shi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM
- Publication number 20220137380
- Publication date May 5, 2022
- KLA Corporation
- Alex ZHENG
- G02 - OPTICS
Information Patent Application
MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS
- Publication number 20200302965
- Publication date Sep 24, 2020
- KLA Corporation
- Jun Wang
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-Pin Dense Array Resistivity Probe
- Publication number 20200072869
- Publication date Mar 5, 2020
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Multi-Pin Dense Array Resistivity Probe
- Publication number 20180052189
- Publication date Feb 22, 2018
- KLA-Tencor Corporation
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD
- Publication number 20130300445
- Publication date Nov 14, 2013
- Walter H. Johnson
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND...
- Publication number 20130003050
- Publication date Jan 3, 2013
- KLA-Tencor Corporation
- NanChang Zhu
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING ONE OR MORE PROPERTIES OF A SPE...
- Publication number 20070126458
- Publication date Jun 7, 2007
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Application
Test Pads, Methods and Systems for Measuring Properties of a Wafer
- Publication number 20070109003
- Publication date May 17, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Jianou Shi
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Controlling Deposition of a Charge on a Waf...
- Publication number 20070069759
- Publication date Mar 29, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Jeffrey A. Rzepiela
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining one or more properties of a spe...
- Publication number 20050206402
- Publication date Sep 22, 2005
- Jianou Shi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Reflective compact lens for magneto-optic Kerr effect metrology system

Resistivity probes with curved portions

Magneto-optic Kerr effect metrology systems

Resistivity probe having movable needle bodies

Variable spacing four-point probe pin device and method

System and method for nondestructively measuring concentration and...

Method and apparatus for determining dielectric layer properties

Systems and methods for controlling deposition of a charge on a waf...

Systems configured to perform a non-contact method for determining...

Contactless charge measurement of product wafers and control of cor...

Measurement of effective capacitance

Methods for imperfect insulating film electrical thickness/capacita...

Corona based charge voltage measurement

Contactless charge measurement of product wafers and control of cor...

Methods and systems for determining one or more properties of a spe...

Systems and methods for using non-contact voltage sensors and coron...

Non-contact methods for measuring electrical thickness and determin...

Corona based charge voltage measurement

Methods for imperfect insulating film electrical thickness/capacita...

Methods and systems for determining an electrical property of an in...

Systems and methods for using non-contact voltage sensors and coron...

UV exposure for improving properties and adhesion of dielectric pol...

Method of minimizing reactive ion etch damage of organic insulating...

Patents Applicationslast 30 patents

REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM

MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEMS

Multi-Pin Dense Array Resistivity Probe

Multi-Pin Dense Array Resistivity Probe

VARIABLE SPACING FOUR-POINT PROBE PIN DEVICE AND METHOD

SYSTEM AND METHOD FOR NONDESTRUCTIVELY MEASURING CONCENTRATION AND...

METHODS AND SYSTEMS FOR DETERMINING ONE OR MORE PROPERTIES OF A SPE...

Test Pads, Methods and Systems for Measuring Properties of a Wafer

Systems and Methods for Controlling Deposition of a Charge on a Waf...

Methods and systems for determining one or more properties of a spe...