Jianping Yan

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for low-pin-count scan compression
- Patent number 8,230,282
- Issue date Jul 24, 2012
- Syntest Technologies, Inc.
- Nur A. Touba
- G01 - MEASURING TESTING
Information Patent Grant
Multiple-capture DFT system to reduce peak capture power during sel...
- Patent number 8,091,002
- Issue date Jan 3, 2012
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for low-pin-count scan compression
- Patent number 7,996,741
- Issue date Aug 9, 2011
- Syntest Technologies, Inc.
- Nur A. Touba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
- Publication number 20120266036
- Publication date Oct 18, 2012
- Syntest Technologies, Inc.
- Nur A. TOUBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR LOW-PIN-COUNT SCAN COMPRESSION
- Publication number 20110047426
- Publication date Feb 24, 2011
- Nur A. TOUBA
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE-CAPTURE DFT SYSTEM TO REDUCE PEAK CAPTURE POWER DURING SEL...
- Publication number 20100287430
- Publication date Nov 11, 2010
- Syntest Technologies, Inc.
- Laung-Terng WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DELAY FAULT COVERAGE ENHANCEMENT
- Publication number 20100138709
- Publication date Jun 3, 2010
- Laung-Terng WANG
- G01 - MEASURING TESTING