Jianqiang HU

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method of preparing a sample for transmission electron microscopy
- Patent number 7,649,173
- Issue date Jan 19, 2010
- Semiconductor Manufacturing International (Shanghai) Corporation
- Jianqiang Hu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PREPARING A SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20080078742
- Publication date Apr 3, 2008
- SEMICONDUCTOR MANUFACTURING INTERNATIONAL (Shangha i) CORPORATION
- Jianqiang HU
- G01 - MEASURING TESTING