Jianwei WANG

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Contour-based array inspection of patterned defects
- Patent number 9,483,819
- Issue date Nov 1, 2016
- KLA-Tencor Corporation
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real-time implementation of field programmable gate arrays (FPGA) d...
- Patent number 7,366,326
- Issue date Apr 29, 2008
- University of Maryland, Baltimore County
- Chein-I Chang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS
- Publication number 20140212024
- Publication date Jul 31, 2014
- KLA-Tencor Corporation
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
Real-time implementation of field programmable gate arrays (FPGA) d...
- Publication number 20050015418
- Publication date Jan 20, 2005
- Chein-I Chang
- G06 - COMPUTING CALCULATING COUNTING